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Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)
standard by SAE International, 07/12/2016
Description
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
Product Details
- Published:
- 07/12/2016
- File Size:
- 1 file , 170 KB
- Redline File Size:
- 2 files , 2.2 MB
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